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Company Interview Excerpt
VINOD AGARWAL - LOGICVISION INC (LGYN)


Full article published: 11/10/2003


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TWST: Could we begin with a brief historical sketch of LogicVision and a picture of what you're doing at the present time?
Dr. Agarwal: LogicVision is a pioneer in the emerging Embedded Test Technology and the largest provider of commercial intellectual property and software for embedded tests in the semiconductor industry. Our business is to modify the DNA of a chip so that it can perform self- testing and self-diagnosis throughout its life cycle. With LogicVision technology, semiconductor companies expect to save hundreds of millions of dollars in capital expenses, achieve better time to market and realize lower manufacturing costs. More than 100 companies worldwide, from fabless startups to prominent blue chip companies including Agere Systems, Broadcom, Cisco, LSI Logic, National Semiconductor, Sony and Sun Microsystems have used our products.

TWST: Could you explain your product in more detail?
Dr. Agarwal: Every silicon chip goes through several development and manufacturing phases. The first phase is when a chip is being designed and developed. The next phase is when a prototype chip is manufactured and goes through a debug process to ensure that the first silicon is fully functioning. After diagnosed as fully functioning, the next phase is high volume production. Once produced, the chips are installed into various electronic systems. LogicVision's technology provides propriety technologies at the design for a semiconductor chip to test itself. Therefore, when a first silicon or volume production chip comes back, instead of using very sophisticated and expensive testers and corresponding test programs, a customer would actually use testing capabilities that are directly built inside the chip using our Embedded Test technology with minimum requirements from outside. LogicVision's embedded test technology enables manufacturers to reduce the cost of test significantly. It also reduces the time that is required to debug silicon. Furthermore, it increases the quality of test because the chips are being tested at-speed.

 

Tickers included in this excerpt: LGYN

 

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